Pathology of pet and aviary birds RE Schmidt, JD Struthers, DN Phalen John Wiley & Sons, 2024 | 335 | 2024 |
Defect classes-an overdue paradigm for CMOS IC testing CF Hawkins, JM Soden, AW Righter, FJ Ferguson Proceedings., International Test Conference, 413-425, 1995 | 270 | 1995 |
I DDQ testing: A review JM Soden, CF Hawkins, RK Gulati, W Mao Journal of Electronic Testing 3, 291-303, 1992 | 260 | 1992 |
Long-term inhalation toxicity of hydrazine EH Vernot, JD MacEwen, RH Bruner, CC Haun, ER Kinkead, DE Prentice, ... Fundamental and Applied Toxicology 5 (6), 1050-1064, 1985 | 255 | 1985 |
Patterns of fish spawning in Hudson River tributaries: response to an urban gradient? KE Limburg, RE Schmidt Ecology 71 (4), 1238-1245, 1990 | 216 | 1990 |
A Nitsche‐type formulation and comparison of the most common domain decomposition methods in isogeometric analysis A Apostolatos, R Schmidt, R Wüchner, KU Bletzinger International Journal for Numerical Methods in Engineering 97 (7), 473-504, 2014 | 215 | 2014 |
Electrical characteristics and testing considerations for gate oxide shorts in CMOS ICs CF Hawkins, JM Soden Presented at the International Test Conference, 1985 | 204 | 1985 |
Isogeometric analysis of trimmed NURBS geometries R Schmidt, R Wüchner, KU Bletzinger Computer Methods in Applied Mechanics and Engineering 241, 93-111, 2012 | 199 | 2012 |
Adaptable architecture: Theory and practice R Schmidt III, S Austin Routledge, 2016 | 194 | 2016 |
Quiescent power supply current measurement for CMOS IC defect detection CF Hawkins, JM Soden, RR Fritzemeier, LK Horning IEEE Transactions on Industrial Electronics 36 (2), 211-218, 1989 | 192 | 1989 |
Test considerations for gate oxide shorts in CMOS ICs JM Soden, CF Hawkins IEEE Design & Test of Computers 3 (4), 56-64, 1986 | 169 | 1986 |
Reliability and electrical properties of gate oxide shorts in CMOS ICs CF Hawkins, JM Soden New Mexico Univ., Albuquerque (USA). Dept. of Electrical Engineering and …, 1986 | 165 | 1986 |
Electrical properties and detection methods for CMOS IC defects JM Soden, CF Hawkins Proceedings of the 1st European Test Conference, 159,160,161,162,163,164,165 …, 1989 | 162 | 1989 |
Increased CMOS IC stuck-at fault coverage with reduced I/sub DDQ/test sets RR Fritzemeier, JM Soden, RK Treece, CF Hawkins Proceedings. International Test Conference 1990, 427-435, 1990 | 153 | 1990 |
Hepatomas in Atlantic tomcod Microgadus tomcod (Walbaum) collected in the Hudson River estuary in New York CE Smith, TH Peck, RJ Klauda, JB McLaren Journal of Fish Diseases 2 (4), 313-319, 1979 | 146 | 1979 |
CMOS IC stuck-open-fault electrical effects and design considerations JM Soden, RK Treece, MR Taylor, CF Hawkins Proceedings.'Meeting the Tests of Time'., International Test Conference, 423-430, 1989 | 138 | 1989 |
The behavior and testing implications of CMOS IC logic gate open circuits CL Henderson, JM Soden, CF Hawkins Sandia National Labs., Albuquerque, NM (United States), 1991 | 137 | 1991 |
An assessment of a bait industry and angler behavior as a vector of invasive species JV Kilian, RJ Klauda, S Widman, M Kashiwagi, R Bourquin, S Weglein, ... Biological Invasions 14, 1469-1481, 2012 | 134 | 2012 |
Novel failure analysis techniques using photon probing with a scanning optical microscope EI Cole, JM Soden, JL Rife, DL Barton, CL Henderson Proceedings of 1994 IEEE International Reliability Physics Symposium, 388-398, 1994 | 130 | 1994 |
Zoogeography of the northern Appalachians RE Schmidt The zoogeography of North American freshwater fishes, 137-159, 1986 | 122 | 1986 |