Pete R. Jemian
Pete R. Jemian
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Irena: tool suite for modeling and analysis of small-angle scattering
J Ilavsky, PR Jemian
Journal of Applied Crystallography 42 (2), 347-353, 2009
Glassy carbon as an absolute intensity calibration standard for small-angle scattering
F Zhang, J Ilavsky, GG Long, JPG Quintana, AJ Allen, PR Jemian
Metallurgical and Materials Transactions A 41, 1151-1158, 2010
Ultra-small-angle X-ray scattering at the Advanced Photon Source
J Ilavsky, PR Jemian, AJ Allen, F Zhang, LE Levine, GG Long
Journal of Applied Crystallography 42 (3), 469-479, 2009
Development of combined microstructure and structure characterization facility for in situ and operando studies at the Advanced Photon Source
J Ilavsky, F Zhang, RN Andrews, I Kuzmenko, PR Jemian, LE Levine, ...
Journal of applied crystallography 51 (3), 867-882, 2018
Ultra-small-angle X-ray scattering instrument at the advanced photon source: history, recent development, and current status
J Ilavsky, F Zhang, AJ Allen, LE Levine, PR Jemian, GG Long
Metallurgical and Materials Transactions A 44, 68-76, 2013
The NeXus data format
M Könnecke, FA Akeroyd, HJ Bernstein, AS Brewster, SI Campbell, ...
Journal of applied crystallography 48 (1), 301-305, 2015
Determination of phonon dispersions from x-ray transmission scattering: The example of silicon
M Holt, Z Wu, H Hong, P Zschack, P Jemian, J Tischler, H Chen, ...
Physical review letters 83 (16), 3317, 1999
High-resolution small-angle X-ray scattering camera for anomalous scattering
GG Long, PR Jemian, JR Weertman, DR Black, HE Burdette, R Spal
Journal of applied crystallography 24 (1), 30-37, 1991
Characterization of 9Cr-1MoVNb steel by anomalous small-angle X-ray scattering
PR Jemian, JR Weertman, GG Long, RD Spal
Acta metallurgica et materialia 39 (11), 2477-2487, 1991
Effective pinhole-collimated ultrasmall-angle x-ray scattering instrument for measuring anisotropic microstructures
J Ilavsky, AJ Allen, GG Long, PR Jemian
Review of scientific instruments 73 (3), 1660-1662, 2002
Dedicated full-field X-ray imaging beamline at Advanced Photon Source
Q Shen, WK Lee, K Fezzaa, YS Chu, F De Carlo, P Jemian, J Ilavsky, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2007
Micro-to Nanoscale Structure of Biocompatible PLA− PEO− PLA Hydrogels
SK Agrawal, N Sanabria-DeLong, PR Jemian, GN Tew, SR Bhatia
Langmuir 23 (9), 5039-5044, 2007
Challenges and opportunities in complex materials: silica-reinforced elastomers
DW Schaefer, C Suryawanshi, P Pakdel, J Ilavsky, PR Jemian
Physica A: Statistical Mechanics and its Applications 314 (1-4), 686-695, 2002
Quantitative measurement of nanoparticle halo formation around colloidal microspheres in binary mixtures
F Zhang, GG Long, PR Jemian, J Ilavsky, VT Milam, JA Lewis
Langmuir 24 (13), 6504-6508, 2008
High-energy ultra-small-angle X-ray scattering instrument at the advanced photon source
J Ilavsky, AJ Allen, LE Levine, F Zhang, PR Jemian, GG Long
Journal of Applied Crystallography 45 (6), 1318-1320, 2012
Non-cavitation tensile creep in Lu-doped silicon nitride
F Lofaj, SM Wiederhorn, GG Long, BJ Hockey, PR Jemian, L Browder, ...
Journal of the European Ceramic Society 22 (14-15), 2479-2487, 2002
Silicon photodiode detector for small-angle x-ray scattering
PR Jemian, GG Long
Journal of applied crystallography 23 (5), 430-432, 1990
Small-angle-scattering determination of the microstructure of porous silica precursor bodies
GG Long, S Krueger, PR Jemian, DR Black, HE Burdette, JP Cline, ...
Journal of applied crystallography 23 (6), 535-544, 1990
In situ ultra-small-angle X-ray scattering study of the solution-mediated formation and growth of nanocrystalline ceria
AJ Allen, VA Hackley, PR Jemian, J Ilavsky, JM Raitano, SW Chan
Journal of Applied Crystallography 41 (5), 918-929, 2008
Tensile creep in the next generation silicon nitride
FŠE Lofaj, SM Wiederhorn, GG Long, PR Jemian
25th Annual Conference on Composites, Advanced Ceramics, Materials, and …, 2001
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