| Uniaxial-process-induced strained-Si: Extending the CMOS roadmap SE Thompson, G Sun, YS Choi, T Nishida IEEE Transactions on electron Devices 53 (5), 1010-1020, 2006 | 702 | 2006 |
| Physics of strain effects in semiconductors and metal-oxide-semiconductor field-effect transistors Y Sun, SE Thompson, T Nishida Journal of Applied Physics 101 (10), 104503, 2007 | 601 | 2007 |
| Lumped element modeling of piezoelectric-driven synthetic jet actuators Q Gallas, R Holman, T Nishida, B Carroll, M Sheplak, L Cattafesta AIAA journal 41 (2), 240-247, 2003 | 383 | 2003 |
| Strain effect in semiconductors: theory and device applications Y Sun, SE Thompson, T Nishida Springer Science & Business Media, 2009 | 345 | 2009 |
| Comprehensive characterization and failure modes of tungsten microwire arrays in chronic neural implants A Prasad, QS Xue, V Sankar, T Nishida, G Shaw, WJ Streit, JC Sanchez Journal of neural engineering 9 (5), 056015, 2012 | 300 | 2012 |
| A MEMS acoustic energy harvester SB Horowitz, M Sheplak, LN Cattafesta, T Nishida Journal of Micromechanics and Microengineering 16 (9), S174, 2006 | 273 | 2006 |
| Key differences for process-induced uniaxial vs. substrate-induced biaxial stressed Si and Ge channel MOSFETs S Thompson, G Sun, K Wu, J Lim, T Nishida IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004 …, 2004 | 272 | 2004 |
| Direct-current measurements of oxide and interface traps on oxidized silicon A Neugroschel, CT Sah, KM Han, MS Carroll, T Nishida, JT Kavalieros, ... IEEE Transactions on Electron Devices 42 (9), 1657-1662, 1995 | 227 | 1995 |
| Acoustic energy harvesting using an electromechanical Helmholtz resonator F Liu, A Phipps, S Horowitz, K Ngo, L Cattafesta, T Nishida, M Sheplak The Journal of the Acoustical Society of America 123 (4), 1983-1990, 2008 | 190 | 2008 |
| Energy reclamation from a vibrating piezoceramic composite beam A Kasyap, J Lim, D Johnson, S Horowitz, T Nishida, K Ngo, M Sheplak, ... Proceedings of 9th International Congress on sound and vibration 9 (271), 36-43, 2002 | 178 | 2002 |
| Abiotic-biotic characterization of Pt/Ir microelectrode arrays in chronic implants A Prasad, QS Xue, R Dieme, V Sankar, RC Mayrand, T Nishida, WJ Streit, ... Frontiers in neuroengineering 7, 2, 2014 | 176 | 2014 |
| TaN interface properties and electric field cycling effects on ferroelectric Si-doped HfO2 thin films PD Lomenzo, Q Takmeel, C Zhou, CM Fancher, E Lambers, ... Journal of Applied Physics 117 (13), 134105, 2015 | 161 | 2015 |
| Corrosion of tungsten microelectrodes used in neural recording applications E Patrick, ME Orazem, JC Sanchez, T Nishida Journal of neuroscience methods 198 (2), 158-171, 2011 | 156 | 2011 |
| Process compatible polysilicon-based electrical through-wafer interconnects in silicon substrates EM Chow, V Chandrasekaran, A Partridge, T Nishida, M Sheplak, ... Journal of Microelectromechanical systems 11 (6), 631-640, 2002 | 130 | 2002 |
| Hole mobility in silicon inversion layers: Stress and surface orientation G Sun, Y Sun, T Nishida, SE Thompson Journal of Applied Physics 102 (8), 084501, 2007 | 126 | 2007 |
| Ferroelectric phenomena in Si-doped HfO2 thin films with TiN and Ir electrodes PD Lomenzo, P Zhao, Q Takmeel, S Moghaddam, T Nishida, M Nelson, ... Journal of Vacuum Science & Technology B, Nanotechnology and …, 2014 | 115 | 2014 |
| Effect of external strain on the conductivity of AlGaN/GaN high-electron-mobility transistors BS Kang, S Kim, J Kim, F Ren, K Baik, SJ Pearton, BP Gila, CR Abernathy, ... Applied physics letters 83 (23), 4845-4847, 2003 | 110 | 2003 |
| Development of a micromachined piezoelectric microphone for aeroacoustics applications S Horowitz, T Nishida, L Cattafesta, M Sheplak the journal of the acoustical society of America 122 (6), 3428-3436, 2007 | 108 | 2007 |
| Piezoresistance Coefficients of (100) Silicon nMOSFETs Measured at Low and High (1.5 GPa) Channel Stress S Suthram, JC Ziegert, T Nishida, SE Thompson IEEE electron device letters 28 (1), 58-61, 2006 | 107 | 2006 |
| Future of strained Si/semiconductors in nanoscale MOSFETs SE Thompson, S Suthram, Y Sun, G Sun, S Parthasarathy, M Chu, ... 2006 International Electron Devices Meeting, 1-4, 2006 | 103 | 2006 |
