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Co-authors
- Khai NgoProfessor of Electrical and Computer Engineering, Virginia TechVerified email at vt.edu
- Xu ChenTianjin UniversityVerified email at tju.edu.cn
- Xin LiTianjin UniversityVerified email at tju.edu.cn
- Dushan BoroyevichVirginia TechVerified email at vt.edu
- Gang ChenSchool of Chemical Engineering and Technology, Tianjin UniversityVerified email at tju.edu.cn
- Rolando BurgosProfessor at Virginia Tech, Center for Power Electronics Systems (CPES)Verified email at vt.edu
- Xiao CaoElectrical and computing engineering, Virginia TechVerified email at vt.edu
- Michael J. AzizGene and Tracy Sykes Professor of Materials and Energy Technologies, Harvard School of EngineeringVerified email at harvard.edu
- Fei (Fred) WangUniversity of Tennessee, KnoxvilleVerified email at utk.edu
- Dunji YuOak Ridge National LaboratoryVerified email at ornl.gov
- Zheng ChenDanfoss Silicon PowerVerified email at danfoss.com
- David A. DillardAdhesive and Sealant Science Professor of Biomedical Engineering and Mechanics, Virginia TechVerified email at vt.edu