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Co-authors
- Mustapha BenjillaliINRS-Canada, KAUST-KSA, INPT-MoroccoVerified email at ieee.org
- Prof. Alex AlvaradoDepartment of Electrical Engineering, Eindhoven University of TechnologyVerified email at ieee.org
- Ali GhrayebIEEE Fellow, Professor, Hamad Bin Khalifa University, QatarVerified email at hbku.edu.qa
- F. LabeauMcGill UniversityVerified email at mcgill.ca
- Roman Z. MorawskiProfessor of Measurement Science, Warsaw University of TechnologyVerified email at ire.pw.edu.pl
- pierre duhamelCNRS/CentraleSupelec, Laboratoire de Signaux et Systèmes (L2S)Verified email at lss.supelec.fr
- Saeed Reza KhosraviradBell Labs, NokiaVerified email at nokia-bell-labs.com
- Maël LE TREUSTCNRS Researcher at IRISA UMR 6074, Rennes FranceVerified email at cnrs.fr
- Daniel MassicotteUniversite du Quebec a Trois-RivieresVerified email at uqtr.ca
- MD Jahangir HossainProfessor, School of Engineering, The University of British Columbia, Kelowna, CanadaVerified email at ubc.ca