| Handbook of statistics. v. 16: Order statistics: theory and methods N Balakrishnan, CR Rao | 206* | 1998 |
| Optimal step-stress test under progressive Type-I censoring E Gouno, A Sen, N Balakrishnan IEEE transactions on reliability 53 (3), 388-393, 2004 | 181 | 2004 |
| Reconnection scaling experiment: A new device for three-dimensional magnetic reconnection studies I Furno, T Intrator, E Torbert, C Carey, MD Cash, JK Campbell, WJ Fienup, ... Review of scientific instruments 74 (4), 2324-2331, 2003 | 67 | 2003 |
| Ch. 23. Step-stress accelerated life test E Gouno, N Balakrishnan Handbook of statistics 20, 623-693, 2001 | 56 | 2001 |
| Corrections on" Optimal step-stress test under progressive Type-I censoring D Han, N Balakrishnan, A Sen, E Gouno IEEE Transactions on Reliability 55 (4), 613-614, 2006 | 52 | 2006 |
| An inference method for temperature step‐stress accelerated life testing E Gouno Quality and Reliability Engineering International 17 (1), 11-18, 2001 | 49 | 2001 |
| Optimum step‐stress for temperature accelerated life testing E Gouno Quality and Reliability Engineering International 23 (8), 915-924, 2007 | 33 | 2007 |
| Bayesian inference for Common cause failure rate based on causal inference with missing data HD Nguyen, E Gouno Reliability Engineering & System Safety 197, 106789, 2020 | 15 | 2020 |
| Maximum likelihood and Bayesian inference for common-cause of failure model HD Nguyen, E Gouno Reliability Engineering & System Safety 182, 56-62, 2019 | 12 | 2019 |
| Estimation from aggregate data E Gouno, L Courtrai, M Fredette Computational statistics & data analysis 55 (1), 615-626, 2011 | 11 | 2011 |
| A Bayesian method for inference on step-stress testing E Gouno Proceeding of the Second International Conference on Mathematical Methods in …, 2000 | 7 | 2000 |
| Failure Rate Estimation from Field Data under Time‐Varying Stress L Guérineau, E Gouno Quality and Reliability Engineering International 30 (1), 111-119, 2014 | 6 | 2014 |
| Bayesian approach of failure rate estimation in field conditions through accelerated testing E Gouno, G Deleuze, M Brizoux, C Robert Proceedings of IEEE 43rd Electronic Components and Technology Conference …, 1993 | 6 | 1993 |
| Step‐stress testing E Gouno Encyclopedia of Statistical Sciences 13, 2004 | 4 | 2004 |
| Failure rate estimation in a dynamic environment E Gouno, L Guérineau Economic Quality Control 30 (1), 1-8, 2015 | 3 | 2015 |
| Inference for a failure counting process partially observed L Guérineau, E Gouno IEEE Transactions on Reliability 64 (1), 311-319, 2014 | 3 | 2014 |
| Inference fo a one-memory self-exciting point process E Gouno, R Damaj International Conference on Applied Mathematics in Engineering and Reliability, 2016 | 2 | 2016 |
| Modelling Spread of Diseases Using a Survival Analysis Technique E Gouno J Biomet Biostat 2 (113), 2, 2011 | 2 | 2011 |
| Reliability assessment with amalgamated data via the expectation-maximization algorithm E Gouno, L Courtrai IEEE transactions on reliability 47 (4), 425-430, 1998 | 1 | 1998 |
| Problèmes de fiabilité issus de l'industrie: méthodes algorithmiques, méthodes bayésiennes E Gouno | 1 | 1996 |
