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Co-authors
Quanyan ZhuDepartment of Electrical and Computer Engineering, New York UniversityVerified email at nyu.edu
Guanze PengNew York UniversityVerified email at nyu.edu
Yunian PanNew York UniversityVerified email at nyu.edu
Tamer BaşarSwanlund Endowed Chair Emeritus & CAS Professor Emeritus of ECE, University of IllinoisVerified email at illinois.edu
Haozhe LeiDepartment of Electrical and Computer Engineering, Tandon School of Engineering, New York UniversityVerified email at nyu.edu
Xiaosheng ZhuangCity University of Hong KongVerified email at cityu.edu.hk
Bin HanProfessor of Mathematics, University of AlbertaVerified email at ualberta.ca
Shutian Liu 刘曙天New York UniversityVerified email at nyu.edu
Yuhan ZhaoPhD candidate in ECE, New York UniversityVerified email at nyu.edu
Zizhan ZhengTulane UniversityVerified email at tulane.edu
Tianyi XuTulane UniversityVerified email at tulane.edu
Henger LiTulane universityVerified email at tulane.edu
Yunfei GeNew York UniversityVerified email at nyu.edu
Rolf StadlerProfessor, School of EECS, KTH Royal Institute of TechnologyVerified email at kth.se
Kim HammarPh.D. candidate at KTH Royal Institute of TechnologyVerified email at kth.se
Ya-Ting YangDepartment of Electrical and Computer Engineering, Tandon School of Engineering, New York UniversityVerified email at nyu.edu
Sundeep RanganProfessor, ECE, New York University and Associate Director, NYU WirelessVerified email at nyu.edu
Mingsheng YinNew York University; NYU WirelessVerified email at nyu.edu
Xinhong XieMaster of Computer Engineering, New York UniversityVerified email at nyu.edu
Yaqi HuNew York UniversityVerified email at nyu.edu