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Co-authors
- Leon M. TolbertChancellor's Professor in Electrical Engineering, The University of TennesseeVerified email at utk.edu
- Jih-Sheng LaiJames S. Tucker Professor of Electrical and Computer Engineering, Virginia TechVerified email at vt.edu
- Haitham Abu-RubHamad bin Khalifa University, Professor, IEEE FellowVerified email at hbku.edu.qa
- Shuitao YangMichigan State UniversityVerified email at msu.edu
- Qin LeiProfessor at Arizona State UniversityVerified email at asu.edu
- Dong CaoUniversity of DaytonVerified email at ieee.org
- Yushan LiuBeijing Jiaotong University; Texas A&M University at QatarVerified email at ieee.org
- Jin WangThe Ohio State UniversityVerified email at osu.edu
- Shuai JiangGoogleVerified email at google.com
- Hirofumi AkagiTokyo Institute of TechnologyVerified email at ee.titech.ac.jp