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Co-authors
- Xinping GuanShanghai Jiao Tong UniversityVerified email at sjtu.edu.cn
- Cunqing HuaShanghai Jiao Tong UniversityVerified email at sjtu.edu.cn
- Xuemin (Sherman) ShenUniversity Professor, University of WaterlooVerified email at uwaterloo.ca
- Qiaoni HanSchool of Electronic, Information and Electrical Engineering, Shanghai Jiao Tong UniversityVerified email at sjtu.edu.cn
- Haojin ZhuFIEEE, Distinguished Professor, Shanghai Jiao Tong UniversityVerified email at cs.sjtu.edu.cn
- Xiaoli MaProfessor of ECE, Georgia TechVerified email at gatech.edu
- Ning LuAssistant Professor, Department of Electrical and Computer Engineering, Queen's UniversityVerified email at queensu.ca
- Yiyin WangShanghai Jiao Tong UniversityVerified email at sjtu.edu.cn
- Zhengtao DingProfessor of Control Systems, University of ManchesterVerified email at manchester.ac.uk
- haipeng pengBeijing University of Posts and TelecommunicationsVerified email at bupt.edu.cn
- Hao LiangAssociate Professor, Department of Electrical and Computer Engineering, University of AlbertaVerified email at ualberta.ca
- Yichang LiuSML RFIDVerified email at sml.com
- Barry LennoxProfessor of Applied Control, University of ManchesterVerified email at manchester.ac.uk
- Gary FengEducational Testing ServiceVerified email at ets.org