Theo dõi
Utkarshaa Varshney
Utkarshaa Varshney
PhD candidate
Email được xác minh tại unsw.edu.au
Tiêu đề
Trích dẫn bởi
Trích dẫn bởi
Năm
Hydrogen-induced degradation
AC née Wenham, S Wenham, R Chen, C Chan, D Chen, B Hallam, ...
2018 IEEE 7th world conference on photovoltaic energy conversion (WCPEC)(A …, 2018
722018
Evaluating the Impact of SiNx Thickness on Lifetime Degradation in Silicon
U Varshney, M Abbott, A Ciesla, D Chen, S Liu, C Sen, M Kim, S Wenham, ...
IEEE Journal of Photovoltaics 9 (3), 601-607, 2019
552019
Extraction of nickel nanoparticles from electroplating waste and their application in production of bio-diesel from biowaste
AK Sharma, S Desnavi, C Dixit, U Varshney, A Sharma
International Journal of Chemical Engineering and Applications 6 (3), 156, 2015
542015
Annealing prior to contact firing: A potential new approach to suppress LeTID
C Sen, C Chan, P Hamer, M Wright, U Varshney, S Liu, D Chen, ...
Solar Energy Materials and Solar Cells 200, 109938, 2019
392019
Assessing the impact of thermal profiles on the elimination of light-and elevated-temperature-induced degradation
C Sen, M Kim, D Chen, U Varshney, S Liu, A Samadi, A Ciesla, ...
IEEE Journal of Photovoltaics 9 (1), 40-48, 2018
372018
Controlling light-and elevated-temperature-induced degradation with thin film barrier layers
U Varshney, B Hallam, P Hamer, A Ciesla, D Chen, S Liu, C Sen, ...
IEEE Journal of Photovoltaics 10 (1), 19-27, 2019
362019
Impact of dark annealing on the kinetics of light-and elevated-temperature-induced degradation
S Liu, D Payne, CV Castrillon, D Chen, M Kim, C Sen, U Varshney, ...
IEEE Journal of Photovoltaics 8 (6), 1494-1502, 2018
342018
Investigation of temperature and illumination dependencies of carrier-induced degradation in p-type multi-crystalline silicon
S Liu, C Chan, D Chen, M Kim, C Sen, U Varshney, B Hallam, M Abbott, ...
AIP Conference Proceedings 1999 (1), 2018
202018
Impact of substrate thickness on the degradation in multicrystalline silicon
U Varshney, M Kim, MU Khan, P Hamer, C Chan, M Abbott, B Hoex
IEEE Journal of Photovoltaics 11 (1), 65-72, 2020
172020
Understanding light-and elevated temperature-induced degradation in silicon wafers using hydrogen effusion mass spectroscopy
S Jafari, U Varshney, B Hoex, S Meyer, D Lausch
IEEE Journal of Photovoltaics 11 (6), 1363-1369, 2021
142021
Influence of dielectric passivation layer thickness on LeTID in multicrystalline silicon
U Varshney, MD Abbott, S Liu, D Chen, M Kim, C Sen, DNR Payne, ...
2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC)(A …, 2018
142018
Different extent and behaviour of LeTID in the past and current PERC silicon solar cells
C Sen, C Chan, D Chen, M Wright, U Varshney, M Kim, A Samadi, S Liu, ...
Asia-Pacific Solar Research Conference, 2019
82019
Electronic applications of graphene mechanical resonators
A Sharma, U Varshney, Y Lu
IET Circuits, Devices & Systems 9 (6), 413-419, 2015
82015
Hydrogenation of dislocations in p-type cast-mono silicon
A Samadi, C Sen, S Liu, U Varshney, D Chen, M Kim, AM Soufiani, ...
AIP Conference Proceedings 2147 (1), 2019
52019
Impact of wafer properties and production processes on the degradation in industrial PERC solar cells
U Varshney, WM Li, X Li, C Chan, B Hoex
2020 47th IEEE Photovoltaic Specialists Conference (PVSC), 0803-0806, 2020
32020
Acceleration and Mitigation of Hydrogen Induced Degradation in p-type Cast-mono Silicon
S Liu, D Payne, D Chen, U Varshney, A Samadi, C Sen, B Hallam, ...
Asia-Pacific Sol. Res. Conf, 9-10, 0
1
Examining the influence of surface dielectric layers and bulk properties in light-and elevated temperature-induced degradation in crystalline silicon
U Varshney
UNSW Sydney, 2021
2021
Light-Induced Degradation And Recovery In Multicrystalline Silicon: Dependence On Wafer Thickness
U Varshney, M Kim, MU Khan, P Hamer, C Chan, M Abbott, B Hoex
2020
Performance Evaluation of a DC Direct-Coupled PV System in comparison with a Typical Grid-connected AC System for a Commercial Building
U Varshney
State University of New York at Stony Brook, 2016
2016
Impact of Substrate Thickness on Light-Induced Degradation in Multicrystalline Silicon
U Varshney, MU Khan, P Hamer, C Sen, D Chen
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Bài viết 1–20