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Neha Sharan
Neha Sharan
Research Scholar, Indian Institute of Science
Verified email at dese.iisc.ernet.in
Title
Cited by
Cited by
Year
A short-channel common double-gate MOSFET model adapted to gate oxide thickness asymmetry
N Sharan, S Mahapatra
IEEE Transactions on Electron Devices 61 (8), 2732-2737, 2014
152014
Ge devices: A potential candidate for sub-5-nm nodes?
N Sharan, KA Shaik, D Jang, P Schuddinck, D Yakimets, MG Bardon, ...
IEEE Transactions on Electron Devices 66 (11), 4997-5002, 2019
102019
Nonquasi-static charge model for common double-gate MOSFETs adapted to gate oxide thickness asymmetry
N Sharan, S Mahapatra
IEEE transactions on electron devices 60 (7), 2419-2422, 2013
92013
Impact of strain and channel thickness on performance of biaxial strained silicon MOSFETs
N Sharan, AK Rana
International Journal of VLSI Design & Communication Systems 2 (1), 61-71, 2011
82011
Experimental validation of process-induced variability aware SPICE simulation platform for sub-20 nm FinFET technologies
A Rawat, N Sharan, D Jang, T Chiarella, FM Bufler, F Catthoor, B Parvais, ...
IEEE Transactions on Electron Devices 68 (3), 976-980, 2021
62021
Cost effective FinFET platform for stand alone DRAM 1Y and beyond memory periphery
A Spessot, N Sharan, H Oh, R Ritzenthaler, ED Litta, B O'Sullivan, ...
2018 IEEE International Memory Workshop (IMW), 1-4, 2018
52018
Compact noise modelling for common double‐gate metal–oxide–semiconductor field‐effect transistor adapted to gate‐oxide‐thickness asymmetry
N Sharan, S Mahapatra
IET Circuits, Devices & Systems 10 (1), 62-67, 2016
52016
Design and Performance Comparison of CNTFET-Based Binary and Ternary Logic Inverter and Decoder With 32 nm CMOS Technology
M Khandelwal, N Sharan
Advances in Computer and Computational Sciences: Proceedings of ICCCCS 2016 …, 2017
32017
Characterization of 6T CMOS SRAM in 90nm technology for various leakage reduction techniques
A Chauhan, DS Chauhan, N Sharan
2016 IEEE Students' Conference on Electrical, Electronics and Computer …, 2016
22016
Continuity equation based nonquasi-static charge model for independent double gate MOSFET
N Sharan, S Mahapatra
Journal of Computational Electronics 13, 353-359, 2014
22014
Compact Modeling of Short Channel Common Double Gate MOSFET Adapted to Gate-Oxide Thickness Asymmetry
N Sharan
2018
Device challenges for logic scaling for sub-5 nm node
D Jang, M Garcia Bardon, D Yakimets, P Schuddinck, LA Ragnarsson, ...
2018
Reliable techniques of leakage current reduction for SRAM-6T Cell: A review
A Chauhan, DS Chauhan, N Sharan
2016 3rd International Conference on Computing for Sustainable Global …, 2016
2016
indDG: A new compact model for common double gate MOSFET adapted to gate oxide thickness asymmetry
C Kumar, N Sharan, S Mahapatra
2015 IEEE International Conference on Electronics, Computing and …, 2015
2015
Small Signal Nonquasi-static Model for Common Double-Gate MOSFETs Adapted to Gate Oxide Thickness Asymmetry
N Sharan, S Mahapatra
2014 27th International Conference on VLSI Design and 2014 13th …, 2014
2014
Analysis of uniaxial strained silicon MOSFETs performance
NSA Rana
Innovative Conference on Embedded System, Mobile Communication and Computing, 2011
2011
Analysis of VLSI Circuits Designed with Single and Dual Channel Strained Silicon MOSFETs in Nanoregime
N Sharan, A Rana
Journal of VLSI Design Tools & Technology 1 (1), 2011
2011
Performance Evaluation of Strained Channel NMOS in nanoregime
NSA Rana
International Journal of Micro & Nano Systems 2 (1), 53-58, 2011
2011
NQS Modeling of independent DG MOSFET using RTA Approach
N Sharan, S Mahapatra
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