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- Sergey NikishinProfessor of Electrical Engineering, Texas Tech UniversityVerified email at ttu.edu
- Jordan BergUS National Science FoundationVerified email at nsf.gov
- Ayrton BernussiProfessor of Electrical and Computer EngineeringVerified email at ttu.edu
- Zhaoyang FanProfessor of Electrical Engineering, Arizona State UniversityVerified email at asu.edu
- M.NazariVisiting Scholar, Texas State UniversityVerified email at txstate.edu
- Edwin PinerProfessor, Texas State UniversityVerified email at txstate.edu
- Sandeep Sohal, PhDSenior Reliability Engineer, Infinera CorporationVerified email at infinera.com
- Yong Zhao, Ph.D.View, Inc.Verified email at viewglass.com
- yanhan zhuIntel Corp.Verified email at intel.com
- shubhra gangopadhyayProfessor of Electrical EngineeringVerified email at missouri.edu
- D. H. S. MaithripalaUniversity of Peradeniya, Sri LankaVerified email at eng.pdn.ac.lk
- Stefan ZollnerNew Mexico State UniversityVerified email at nmsu.edu
- Iulian GherasoiuSUNY Polytechnic InstituteVerified email at sunyit.edu
- Gulten KARAOGLAN-BEBEKIntelVerified email at intel.com
- R ZallenProfessor of Physics, Virginia TechVerified email at vt.edu
- Luis Grave de PeraltaProfessor of Physics, Texas Tech UniversityVerified email at ttu.edu
- Xuan PanPhD of Electrical Engineering, Nano Tech Center, Texas Tech UniversityVerified email at ttu.edu
- Raju Ahmed, Ph. D.Sr R&D Engineer at Micron TechnologyVerified email at micron.com
- Dan FeketeProfessor of Physics, Physics Dept., TechnionVerified email at tx.technion.ac.il
- Anwar SiddiqueProduct Engineer, Intel CorpVerified email at intel.com