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Co-authors
- Walid SaadProfessor, Electrical and Computer Engineering, Virginia TechVerified email at vt.edu
- Merouane DebbahKU 6G Center, Khalifa University, CentralesupelecVerified email at centralesupelec.fr
- Bennis MehdiFull Professor, IEEE Fellow, Head of ICON, University of OuluVerified email at oulu.fi
- Xingqin LinNVIDIAVerified email at utexas.edu
- Young Han NamSamsungVerified email at samsung.com
- Mingzhe ChenAssistant Professor, Electrical and Computer Engineering Department, University of MiamiVerified email at miami.edu
- Mehrnaz AfshangEricsson researchVerified email at vt.edu
- HV PoorMichael Henry Strater University Professor, Princeton UniversityVerified email at princeton.edu
- Maurizio MagariniPolitecnico di MilanoVerified email at elet.polimi.it
- Ismail GuvencNorth Carolina State UniversityVerified email at ncsu.edu
- Gerard Lachapelle, Professor EmeritusUniversity of Calgary, Geomatics EngineeringVerified email at ucalgary.ca
- Ali BroumandanUniversity of CalgaryVerified email at ucalgary.ca
- Kyle O'KeefeUniversity of CalgaryVerified email at ucalgary.ca