| Passivating contacts for crystalline silicon solar cells: From concepts and materials to prospects J Melskens, BWH van de Loo, B Macco, LE Black, S Smit, WMM Kessels IEEE Journal of Photovoltaics 8 (2), 373-388, 2018 | 356 | 2018 |
| Optical impedance matching using coupled plasmonic nanoparticle arrays P Spinelli, M Hebbink, R De Waele, L Black, F Lenzmann, A Polman Nano letters 11 (4), 1760-1765, 2011 | 258 | 2011 |
| On effective surface recombination parameters KR McIntosh, LE Black Journal of Applied Physics 116 (1), 2014 | 194 | 2014 |
| Low-Temperature Plasma-Assisted Atomic-Layer-Deposited SnO2 as an Electron Transport Layer in Planar Perovskite Solar Cells Y Kuang, V Zardetto, R van Gils, S Karwal, D Koushik, MA Verheijen, ... ACS applied materials & interfaces 10 (36), 30367-30378, 2018 | 101 | 2018 |
| Surface passivation of c-Si by atmospheric pressure chemical vapor deposition of Al2O3 LE Black, KR McIntosh Applied Physics Letters 100 (20), 202107-202107-5, 2012 | 100 | 2012 |
| Reassessment of the intrinsic bulk recombination in crystalline silicon T Niewelt, B Steinhauser, A Richter, B Veith-Wolf, A Fell, B Hammann, ... Solar Energy Materials and Solar Cells 235, 111467, 2022 | 91 | 2022 |
| Effective Surface Passivation of InP Nanowires by Atomic-Layer-Deposited Al2O3 with POx Interlayer LE Black, A Cavalli, MA Verheijen, JEM Haverkort, E Bakkers, ... Nano letters 17 (10), 6287-6294, 2017 | 87 | 2017 |
| Atomic-layer deposited Nb2O5 as transparent passivating electron contact for c-Si solar cells B Macco, LE Black, J Melskens, BWH van de Loo, WJH Berghuis, ... Solar Energy Materials and Solar Cells 184, 98-104, 2018 | 78 | 2018 |
| Ultralow surface recombination velocity in passivated InGaAs/InP nanopillars A Higuera-Rodriguez, B Romeira, S Birindelli, LE Black, E Smalbrugge, ... Nano letters 17 (4), 2627-2633, 2017 | 78 | 2017 |
| Explorative studies of novel silicon surface passivation materials: Considerations and lessons learned LE Black, BWH Van De Loo, B Macco, J Melskens, WJH Berghuis, ... Solar Energy Materials and Solar Cells 188, 182-189, 2018 | 75 | 2018 |
| New perspectives on surface passivation: Understanding the Si-Al2O3 interface LE Black Springer, 2016 | 62* | 2016 |
| Effect of boron concentration on recombination at the p-Si–Al2O3 interface LE Black, T Allen, KR McIntosh, A Cuevas Journal of Applied Physics 115 (9), 2014 | 58 | 2014 |
| Thermal stability of silicon surface passivation by APCVD Al2O3 LE Black, T Allen, A Cuevas, KR McIntosh, B Veith, J Schmidt Solar Energy Materials and Solar Cells, 2013 | 42 | 2013 |
| An examination of three common assumptions used to simulate recombination in heavily doped silicon K McIntosh, PP Altermatt, T Ratcliff, K Fong, L Black, S Baker-Finch, ... WIP-Renewable Energies, 2013 | 41 | 2013 |
| Modeling Recombination at the Si–Al2O3 Interface LE Black, KR McIntosh IEEE Journal of Photovoltaics 3 (3), 936-943, 2013 | 39 | 2013 |
| Effective passivation of silicon surfaces by ultrathin atomic-layer deposited niobium oxide B Macco, M Bivour, JH Deijkers, SB Basuvalingam, LE Black, J Melskens, ... Applied Physics Letters 112 (24), 2018 | 36 | 2018 |
| On the solid phase crystallization of In2O3: H transparent conductive oxide films prepared by atomic layer deposition B Macco, MA Verheijen, LE Black, B Barcones, J Melskens, WMM Kessels Journal of Applied Physics 120 (8), 2016 | 34 | 2016 |
| Surface Fluorination of ALD TiO2 Electron Transport Layer for Efficient Planar Perovskite Solar Cells V Zardetto, F di Giacomo, H Lifka, MA Verheijen, CHL Weijtens, LE Black, ... Advanced Materials Interfaces 5 (9), 1701456, 2018 | 33 | 2018 |
| Defect Generation at Charge-Passivated Si–SiO2 Interfaces by Ultraviolet Light LE Black, KR McIntosh IEEE Transactions on Electron Devices 57 (8), 1996-2004, 2010 | 29 | 2010 |
| Accounting for the dependence of coil sensitivity on sample thickness and lift-off in inductively coupled photoconductance measurements LE Black, DH Macdonald IEEE Journal of Photovoltaics 9 (6), 1563-1574, 2019 | 28 | 2019 |
W.M.M. (Erwin) KESSELSEindhoven University of TechnologyEmail được xác minh tại tue.nl
