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Sture Petersson
Sture Petersson
Unknown affiliation
Verified email at kth.se
Title
Cited by
Cited by
Year
Quantitative mass and energy dispersive elastic recoil spectrometry: Resolution and efficiency considerations
HJ Whitlow, G Possnert, CS Petersson
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1987
2131987
The Schottky‐barrier height of the contacts between some rare‐earth metals (and silicides) and p‐type silicon
H Norde, J de Sousa Pires, F d’Heurle, F Pesavento, S Petersson, ...
Applied Physics Letters 38 (11), 865-866, 1981
1921981
Diffusion in intermetallic compounds with the CaF2 structure: A marker study of the formation of NiSi2 thin films
F d’Heurle, S Petersson, L Stolt, B Strizker
Journal of applied physics 53 (8), 5678-5681, 1982
1611982
Formation of iridium silicides from Ir thin films on Si substrates
S Petersson, J Baglin, W Hammer, F d’Heurle, TS Kuan, I Ohdomari, ...
Journal of Applied Physics 50 (5), 3357-3365, 1979
1331979
Monte Carlo simulation of electron transport in 4H–SiC using a two‐band model with multiple minima
HE Nilsson, U Sannemo, CS Petersson
Journal of applied physics 80 (6), 3365-3369, 1996
971996
The formation of silicides in Mo-W Bilayer films on si substrates: A marker experiment
J Baglin, J Dempsey, W Hammer, F d’Heurle, S Petersson, C Serrano
Journal of Electronic Materials 8, 641-661, 1979
861979
Characterization of 3D thermal neutron semiconductor detectors
J Uher, C Fröjdh, J Jakůbek, C Kenney, Z Kohout, V Linhart, S Parker, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2007
842007
Nucleation‐controlled thin‐film interactions: Some silicides
R Anderson, J Baglin, J Dempsey, W Hammer, F d’Heurle, S Petersson
Applied Physics Letters 35 (3), 285-287, 1979
731979
Formation of wide and deep pores in silicon by electrochemical etching
P Kleimann, J Linnros, S Petersson
Materials Science and Engineering: B 69, 29-33, 2000
692000
An alternative marker experiment in the formation of Mo and W silicides
J Baglin, F d’Heurle, S Petersson
Applied Physics Letters 33 (4), 289-290, 1978
691978
An interface—marker technique applied to the study of metal silicide growth
JEE Baglin, FM d'Heurle, WN Hammer, S Petersson
Nuclear Instruments and Methods 168 (1-3), 491-497, 1980
681980
The thin‐film formation of rhodium silicides
S Petersson, R Anderson, J Baglin, J Dempsey, W Hammer, F d’Heurle, ...
Journal of Applied Physics 51 (1), 373-382, 1980
621980
Schottky-barrier behavior of metals on n- and p-type
MO Aboelfotoh, C Fröjdh, CS Petersson
physical Review B 67 (7), 075312, 2003
582003
An X-ray imaging pixel detector based on scintillator filled pores in a silicon matrix
P Kleimann, J Linnros, C Fröjdh, CS Petersson
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2001
512001
Schottky‐barrier height of iridium silicide
I Ohdomari, KN Tu, FM d’Heurle, TS Kuan, S Petersson
Applied Physics Letters 33 (12), 1028-1030, 1978
511978
Improvement of an X-ray imaging detector based on a scintillating guides screen
X Badel, A Galeckas, J Linnros, P Kleimann, C Fröjdh, CS Petersson
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2002
502002
An X-ray imaging pixel detector based on a scintillating guides screen
P Kleimann, J Linnros, C Frojdh, CS Petersson
1999 IEEE Nuclear Science Symposium. Conference Record. 1999 Nuclear Science …, 1999
481999
Observations of stresses in thin films of palladium and platinum silicides on silicon
J Angilello, F d’Heurle, S Petersson, A Segmüller
Journal of Vacuum Science and Technology 17 (1), 471-475, 1980
481980
IrSi1.75 a new semiconductor compound
S Petersson, JA Reimer, MH Brodsky, DR Campbell, F d’Heurle, ...
Journal of Applied Physics 53 (4), 3342-3343, 1982
441982
Studies of Formation of Silicides and Their Barrier Heights to Si
KE Sundstrom, S Petersson, P Tove
Physica Status Solidi(a) 20 (2), 653-668, 1973
421973
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